MF118800 - SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline Revision:SEMI MF1188-1107 (Reapproved 0718) - Superseded Originally published October 2000

Originally published October 2000

1  This Standard is a generic specification for electro-optical and mechanical measurement methods of LED light bar used for LCDs

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MF118800 - SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline Revision:SEMI MF1188-1107 (Reapproved 0718) - Superseded Originally published October 2000This Test Method covers the determination of the interstitial oxygen content of single crystal silicon by measurement of an infrared absorption band at room temperature, using a short baseline drawn between 1040 cm1 and 1160 cm1 to reduce the uncertainties due to perturbations in the IR absorption at the end point regions of longer baselines that arise from effects other than absorption by interstitial oxygen. Use of the short baseline results in